Monday, September 2, 2013

DoD Counterfeit Rules Subpar, Expert Tells Congress (UPDATED)

WASHINGTON -- A leading committee member of one of the largest electronics industry trade groups testified to Congress that new rules governing counterfeit components might be too onerous and have unintended consequences that overwhelm the goals of the statute.
As part of the National Defense Authorization Act of 2012, the US Congress directed the Department of Defense to implement certain practices to prevent fake parts from entering the supply chain.
Robert Metzger of Rogers Joseph O'Donnell, vice chair of TechAmerica'ssupply chain subcommittee, said the DoD rules mandating procurement of parts from OEMs or their authorized dealers cannot be followed because of the vast number of systems and the scarcity of available components in the supply chain.
Metzger also argued that the DoD rules fails to adequately define whether certain distributors should be qualified suppliers, and does not distinguish between OEM parts that fail quality inspections versus parts that are fake.
The rule should also provide more guidance on purchasing decisions where parts are determined to be obsolete or otherwise unavailable from trusted suppliers, he added.
Metzger, an attorney who also works on an American Bar Association committee that studies counterfeit parts rules, said his comments were his own views and not necessarily those of TechAmerica or ABA.

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Tuesday, August 27, 2013

Hot Alternative Energy News Stories | AltEnergyMag

Hot Alternative Energy News Stories | AltEnergyMag:

One of the issues that came out of the Roadmap was the rising cost of energy being of concern, not only to make more efficient products, but also the manufacturing costs involved.  Could we make something of this piece in that sense?

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Soldering Practices Are Insane | EE Times

Soldering Practices Are Insane | EE Times:

I think this would be an interesting article to include, perhaps paraphrasing & trying to induce some conversation?

He makes a number of interesting points.  Perhaps also point out that Soldertec used to teach a course on the metallurgy of soldering at the onset of Lead free


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Wednesday, June 26, 2013

EMSNow - NEW WHITE PAPER - Voiding Behavior in Mixed Solder Alloy Systems

EMSNow - NEW WHITE PAPER - Voiding Behavior in Mixed Solder Alloy Systems:

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NEW WHITE PAPER - Voiding Behavior in Mixed Solder Alloy Systems

By Yan Liu, Derrick Herron, Joanna Keck, and Ning-Cheng Lee.

Jun 21, 2013
The voiding behavior of mixed solder alloy systems using a nitrogen reflow atmosphere during BGA assembly was investigated. 

The solder joints were comprised of a combination of Sn62/Pb36/Ag2 (Sn62), Sn63/Pb37 (Sn63), Sn98.5/Ag1/Cu0.5 (SAC105), and Sn96.5/Ag3/Cu0.5 (SAC305) as the solder ball or solder paste, except for the SnPb solder ball, which used lead-free solder pastes. Assembly of each BGA employed a high temperature (HT) profile for lead-free and mixed systems, and a low temperature (LT) profile for mixed and SnPb systems. 

Mixed systems had higher voiding than lead-free systems when reflowed at HT. SnPb systems had a wider voiding range when compared with mixed systems reflowed at LT. Voiding was found to decrease with reduced alloy surface tension; earlier melting of the bottom solder paste; a narrower pasty range; smaller joint overheating; when the top ball remained solid during reflow; and by using flux alone instead of solder paste.

SMTONLINE Surface Tension and Load-Carrying Capacities of Solder

SMTONLINE Surface Tension and Load-Carrying Capacities of Solder: "
Surface Tension and Load-Carrying Capacities of Solder"

Reflow soldering on both sides of a board is standard procedure in the SMT manufacturing process. When the second component side is soldered, the components hang upside-down on the PCB. When the reflow process reaches its peak range, the possibility of remelting previously finished solder joints cannot be ruled out, which leaves the component hanging directly from the molten solder. 

Manufacturers count on the load-carrying capacity of molten solder millions of times a day. Figure 1 shows a component hanging from a drop of solder. Molten solder is entirely capable of bearing considerable component weight.

Read the full article here.



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Wednesday, May 22, 2013

Review on microstructure evolution in Sn-Ag-Cu solders and its effect on mechanical integrity of solder joints

Scopus - Document details: "The use of Pb-bearing solders in electronic assemblies is avoided in many countries due to the inherent toxicity and environmental risks associated with lead. Although a number of "Pb-free" alloys have been invented, none of them meet all the standards generally satisfied by a conventional Pb-Sn alloy. A large number of reliability problems still exist with lead free solder joints. Solder joint reliability depends on mechanical strength, fatigue resistance, hardness, coefficient of thermal expansion which are influenced by the microstructure, type and morphology of inter metallic compounds (IMC). In recent years, Sn rich solders have been considered as suitable replacement for Pb bearing solders. The objective of this review is to study the evolution of microstructural phases in commonly used lead free xSn-yAg-zCu solders and the various factors such as substrate, minor alloying, mechanical and thermo-mechanical strains which affect the microstructure. A complete understanding of the mechanisms that determine the formation and growth of interfacial IMCs is essential for developing solder joints with high reliability. The data available in the open literature have been reviewed and discussed. "

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Extending the fatigue life of Pb-free SAC solder joints under thermal cycling

Scopus - Document details:

This paper reports on the dependence of the thermal fatigue life of Pb-free solder (Sn-3.0Ag-0.5Cu) joints on the points at which the printed circuit board (PCB) is fixed to a rigid support. Elastic-plastic finite element analysis under various thermal cycling conditions was performed. For the analysis, the mechanical boundary conditions around a solder joint bonded silicon chip were varied by changing the points at which the PCB was attached to its support. From the results of the analysis, it was found that the accumulated strain in the solder joints decreased when the PCB was fixed at points placed diagonally with respect to the silicon chip. The thermal fatigue life could therefore be expected to be extended by the choice of fixing points. Using a special support with a thermal expansion coefficient of less than 1.5 × 10-6 K-1, we demonstrated, experimentally, that the accumulated strain and the failure site of the solder joints could indeed be controlled by the positions at which the printed circuit board was fixed. © 2013 Elsevier Ltd. All rights reserved.


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2013 Roadmap | iNEMI

2013 Roadmap | iNEMI:

The 2013 Roadmap was developed by 20 Technology Working Groups (TWGs) in response to inputs regarding technology needs from representatives of OEMs in six Product Emulator Groups (PEGs). These groups included more than 650 individuals from over 350 corporations, consortia, government agencies and universities, located in 18 countries.

Download highlights of the Executive Summary (PDF).

View sample pages (PDF)

Press release (May 14, 2013)

WEBINARS: Introduction to the 2013 Roadmap plus highlights of selected chapters (requires log-in; if you do not have a web account, create one now).

2013 Product Emulator Groups (PEGs)
1.    Aerospace/Defense
2.    Automotive
3.    Consumer/Portable
4.    High-End Systems
5.    Medical
6.    Office Systems

The PEGs define OEM requirements for their respective product sectors, anticipating product technology and business-related needs over a 10-year horizon. These needs are presented in each PEG chapter, using key attribute spreadsheets and text according to templates that are furnished by the iNEMI Technical Committee (TC).  Each PEG has a Chair or Co-chairs and as many group members as needed for a broad-based view of that emulator’s scope (usually 2-5 individuals).

The TWGs use the OEM requirements detailed in the six PEG chapters (as applicable) to prepare each of their roadmap chapters, detailing where their respective technology stands today — and is expected to progress over the next 10 years — with respect to the stated needs.

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Friday, May 10, 2013

FCT Assembly to Present New Technology for Paste Printing at the SMTA Toronto Expo

EMSNow: FCT Assembly will exhibit at the upcoming SMTA Toronto Expo and Tech Forum, scheduled to take place Thursday May 16, 2013 at the Sheraton Toronto Airport Hotel & Conference Centre in Ontario. Keith Howell, Technical Director at Nihon Superior, will hold a technical presentation on nano silver replacement for high lead solders in semiconductor junctions. Keith works closely with the FCT Assembly team, a licensee for Nihon Superior'sSN100C.

FCT Assembly has developed the world's most advanced stencil technology for solder paste printing.  The technology is comprised of a specifically engineered nano coating applied over its proven Slic™ stencil. The technology is surprisingly cost-effective, making improved yields available to all levels of the industry. The technology can be used with current assembly equipment and processes.

The new NanoSlic™ stencil is based on the proven Slic™ stencil with its advanced foil composition and FCTA's state-of-the-art laser cutting process. Then, a permanent nano coating is applied that is based on a revolutionary chemistry platform called Hybrid-T Technology™. The coating imparts a highly hydrophobic and oleophobic surface to the bottom of the stencil and aperture walls. The robust coating should last the life of the stencil.

Using the newly developed NanoSlic™ coating system, NanoSlic™ is sprayed onto the stencil surface and aperture walls, reducing bridging and significantly improving paste release, permitting consistent printing of the smallest area ratios. The technology will be applied by FCT Assembly in its various locations. The user will see following benefits immediately: reduced bridging, reduced underside cleaning, improved paste release and improved yields.

An added benefit, the NanoSlic™ coating, is environmentally friendly. It does not use any Perfluorooctanoic acid (PFOA), a toxic substance currently being investigated by the EPA.

www.fctassembly.com.

EMSNow - Indium Corporation Technology Expert to Present at IMAPS Advanced Technology Workshop

EMSNow - Indium Corporation Technology Expert to Present at IMAPS Advanced Technology Workshop: Indium Corporation's Brook Sandy-Smith, Product Support Specialist - PCB Assembly Materials, will present at the International Microelectronics and Packaging Society (IMAPS) Advanced Technology Workshop on Microelectronic Packaging for Medical and Hi-Reliability Devices May 13-14 in Minneapolis,

Sandy-Smith will present the following papers:

• A Low-Silver SAC Solder Alloy for High-Reliability Applications. This presentation examines the reliability of a low-Ag SAC solder alloy doped with Mn (SACM). SACM is compared to eutectic SnPb, SAC105, SAC305 alloys under various test conditions, such as JEDEC drop shock, dynamic bending, thermal cycling, and cyclic bending.

• Soldering Technologies Enabling Medical Device Packaging in the 3D Era. This paper will review the various forms of soldering for medical electronics and other types of medical devices. It examines how soldering technology is evolving to meet the challenges of smaller devices, which are more sensitive to manufacturing processes. Flux and similar materials that enable new assembly processes in the era of 2.5D and 3D technology will also be discussed.

Sandy-Smith serves as a technical liaison between Indium Corporation's customers and internal departments, such as research and development and production, to ensure the best quality and selection of products. She earned two degrees from the international engineering program at the University of Rhode Island: one in chemical engineering with a focus on materials, the other in German language.

Thursday, May 9, 2013

Method for inhibiting growth of intermetallic compounds

Espacenet - Bibliographic data: The present invention relates to a method for inhibiting growth of intermetallic compounds, comprising the steps of: (i) preparing a substrate element including a substrate on which at least one layer of metal pad is deposited, wherein at least one layer of solder having a thin thickness is deposited onto the layer of metal pad, and then carry out reflowing process; and (ii) further depositing a layer of solder with an appropriate thickness on the substrate element, characterized in that a thin intermetallic compound is formed by the reaction of the solder having a thin thickness and the metal in the metallic pad after appropriate heat treatment of the thin solder. In the present invention, the formation of thin intermetallic compound is able to slow down the growth of the intermetallic compound and to prevent the transformation of the intermetallic compounds. Once the growth of the intermetallic compounds can be inhibited, the growth of Sn whiskers can also be inhibited.

     TW201308451  (A)  -  Method for inhibiting growth of intermetallic compounds
Inventor(s):     CHEN CHIH [TW]; TU KING-NING [US]; HSIAO HSIANG-YAO [TW] +
Applicant(s):     UNIV NAT CHIAO TUNG [TW] +

SMTONLINE IPC Conference Centers on Medical Device Manufacturing

SMTONLINE  Electronic medical device manufacturers are under constant pressure to deliver innovative products on time and within budget, while contending with rapidly changing technologies, increasing product complexity, and strict compliance and safety standards across a global marketplace. To help address these challenges, IPC — Association Connecting Electronics Industries� will host a one-and-a-half day conference, “Innovations in Electronics in Manufacturing for Medical Devices,” June 12-13, 2013 in Minneapolis, Minnesota.

 “Global regulations, lead-free technology, evolving manufacturing processes, reliability demands, and R&D issues are transforming the way medical device companies manage their supply chains,” said Sanjay Huprikar, IPC vice president of member success. “This conference is focused on the innovations taking place in electronics manufacturing at every stage of the medical devices supply chain.”

Subject matter experts from Mayo Clinic, Medtronic, Philips Healthcare, Boston Scientific, St. Jude Medical, Micro Systems Engineering, Sanmina Corporation, Celestica, Jabil, Benchmark Electronics, Endicott Interconnect Technologies, Indium, HDPUG, Frost and Sullivan, and more will help attendees identify new market forces driving cost reductions, discover new lead-free technology breakthroughs, address sustainability challenges, and obtain practical and advanced manufacturing techniques for the age of miniaturization.

SMTONLINE Webinar to Discuss ReUSE Project

SMTONLINE  The NPL Management Ltd will be holding a webinar on May 15 that will discuss the ReUSE (Reuseable, Unzippable, Sustainable Electronics) project, an innovative printed electronics solution to increase the recyclability of electronic assemblies.

The project partners - NPL, GEM Group and In2Tec - designed, developed and tested a series of unzippable polymeric layers which, while withstanding prolonged thermal cycling and damp heat stressing, allow the assemblies to be easily separated at end-of-life into their constituent parts, after immersion in hot water. The project demonstrated a 90% recyclable inverter circuit for an electroluminescent lamp.

The free webinar will run for between 45-60 minutes and will have a Q&A session.

Bi-Sn-BASED HIGH-TEMPERATURE SOLDER ALLOY

Espacenet: A high-temperature solder alloy is a Bi-Sn based solder alloy containing at least 90 mass % of Bi, further containing 1 - 5 mass % of Sn, at least one element selected from Sb and/or Ag each in an amount of 0.5 - 5 mass %, and preferably further containing 0.0004 - 0.01 mass % of P.

EP2589459  (A1)  -  Bi-Sn-BASED HIGH-TEMPERATURE SOLDER ALLOY
Inventor(s):     UESHIMA MINORU [JP]; INAGAWA YOSHIMI [JP]; TOYODA MINORU [JP] +
Applicant(s):     SENJU METAL INDUSTRY CO [JP] +
Classification:    
- international:     B23K1/00; B23K35/26; C22C12/00; H05K3/34; B23K101/40
- cooperative:     B23K1/0016; B23K35/264; C22C12/00; H05K3/3463; B23K2201/42; H05K3/3494;
Application number:     EP20110800638 20110617  

Wednesday, March 13, 2013

Tests of tin-lead BGA packaging for mil-aero applications

Tests of tin-lead BGA packaging for mil-aero applications:
ntroduction

Each year the military and aerospace sector demands higher-speed systems with better accuracy at lower cost. Increasingly stringent size, weight and power constraints, together with the demanding power supply requirements of large FPGAs, have led to a decisive move towards POL (point of load) power supply architectures.

One solution to address these needs is Linear Technology’s µModule technology, providing a system-in-package solution that is claimed to simplify design and minimize external components. 

Figure 1: µModule Product Construction

The original packaging technology selected for µModule switching regulators was LGA (land grid array) and this has served the broad marketplace well. However, some applications subject to very harsh environments prefer BGA (ball grid array) interconnect, and Linear Technology has developed packaging to meet these requirements. 


Figure 2: LGA and BGA package interconnect

In this article, we will take a more detailed look at the comparative performance of LGA and BGA packaging and discuss the merits of gold or tin-lead (SnPb) alloy and lead-free (Pb-free) component finishes.

Component terminal finishes

The European military and aerospace market presents quite a fragmented demand picture when considering component finishes with some companies having adopted Pb-free finishes entirely whilst others have policies to completely avoid them, more common is a mix dictated by the specific needs of individual projects.

A major factor is the continued exclusion of military and aerospace equipment from the RoHS II (Restriction of Hazardous Substances) directive that permits the indefinite use of SnPb component finishes. Of foremost concern is the impact on reliability from the formation of tin whiskers on pure tin plating, leading to potential equipment failures from short-circuits of adjacent fine-pitch conductors. The addition of lead (Pb) to the tin plating remains the industry-standard approach for mitigation of whisker formation.

Weighed against the use of SnPb finishes are the practicalities of component availability, lack of distribution inventory and extended delivery times. By mandating use of SnPb finish companies are also sometimes foregoing access to a wider range of new, Pb-free only components. Whilst this can be overcome by third-party companies offering strip and re-plating or re-balling processes the additional heat cycles and difficultly in re-testing together with the associated costs make this a less desirable approach.

When Pb-free components are used another form of tin whisker mitigation frequently employed is the use of polymer conformal coatings such as Parylene or Arathane which have been shown to resist the penetration of tin whiskers for many years.

Interconnect considerations

Given the mix of needs discussed in the previous section, Linear Technology µModule products in LGA packages offer a universal solution as gold plated pads have been in long-standing use within military and aerospace systems and they have the advantage of also being RoHS compliant.

However, one concern of using gold plated components is gold embrittlement and this is especially true of large BTCs (bottom termination components) subjected to harsh environmental conditions. During reflow gold is dissolved into the solder joint creating weak interfaces in the crystalline structure, the CTE (coefficient of thermal expansion) differences between the gold-tin IMC (intermetallic compound) platelets and the surrounding volume of solder can result in fracturing of the solder joint and an eventual open-circuit when the assembly is repeatedly temperature cycled. A long-standing industry rule of thumb recommends not exceeding a threshold of ~3 wt% gold within the joint, and Linear Technology LGA µModule products meet this requirement for both SnPb and SAC305 paste. Some companies conduct their own trials on BTCs with representative PCBs and environmental conditions using special daisy-chain interconnect samples for this purpose.

Increasing the volume of solder in a joint and the standoff to the PCB improves interconnect reliability by making the joint more compliant. Tests in the military and aerospace industry have concluded that BGA packages are generally preferred over LGA where harsh environmental conditions are likely to be encountered, particularly in airborne systems. An added benefit is that cleaning becomes easier thereby reducing concerns over contaminants.

For these reasons µModule regulators are now offered in BGA packaging in addition to LGA. The downside of the BGA package is slightly reduced thermal efficiency of around 0.5ºC/Watt and an overall increase in component height of 0.6mm. Linear Technology BGA µModule regulators are offered as standard in SAC305 Pb-free configurations and on specific products according to demand with tin-lead Sn63Pb37 balls.
Reliability testing and characteristics

It is important to keep the concerns in perspective, and Linear Technology has conducted extensive trials on interconnect reliability of µModule products with both LGA and BGA configurations.

By way of background, we should distinguish between component tests used in the initial qualification and subsequent reliability monitoring and interconnect tests that are really a characterization of performance with selected PCB configurations, assembly process and temperature cycle parameters.

Extensive µModule product testing at component level indicates an exceptionally high level of reliability with 0.72 FITS (1 FIT = 1 failure in one billion device hours). This article will then focus on interconnect level testing.

Three types of interconnect testing have been performed:

1) Daisy chain testing: where each pad in the µModule regulator is connected to the next to form a complete circuit, monitored in real time during temperature cycling in accordance with IPC-9701 and JESD22-A104. This approach ensures that each pad is tested and since many pads are connected in parallel in the application this is generally preferred over functional testing.


Table 1: LTM4601A daisy chain test results of LGA & BGA

Click on image to enlarge

Note (1): When the 5 failures in table 1 are analyzed with a Weibull distribution plot, it predicts a 1-percent failure point at 1780 cycles. 


Note (2): Subsequent further testing of LGA products with SAC305 (Pb-free) paste to 6000 cycles shows zero failures out of a total of 240 samples of various other µModule products.


Note (3): All BGA packages used SAC305 solder balls


2) Functional testing: where the µModule regulator is temperature cycled and tested for correct operation on an evaluation board. Much testing was performed on LGA µModule regulators comparing Pb-free SnAgCu paste with SnPb paste. However, testing was limited to a maximum of 2000 cycles, which did not produce any failures of either solder.

3) Random vibration testing: conducted in accordance with MIL-STD-202G, method 214A over 50Hz to 2000Hz frequency range and represents a very severe test. Testing of the LTM4610A in LGA-133 passed test letter C at 9.26g RMS but failed in the Z-axis with test letter F at 20.71g RMS. Trials on the LTM4601A in the BGA were conducted and the results are shown below in table 2. Both SnPb and SAC305 (Pb-free) solder gave good results, passing at 20.71g RMS.


Table 2: Random vibration test of BGA-133 package

Conclusions


It is likely that the military and aerospace sector will continue to require a mix of component finishes for the foreseeable future and that manufacturers committed to supporting this market must maintain support for SnPb component finishes.

BTCs such as Linear Technology µModule products with gold-plated LGA packaging have proven reliability and wide industry acceptance. Now BGA versions are providing an alternative to LGA for particularly harsh environment applications.

BGAs with RoHS compliant SAC305 (Pb-free) balls using both SAC305 and SnPb solder paste have been shown to be very reliable and capable of greater than 6000 temperature cycles without failure. For applications where SnPb is mandated, there is now a factory built option of SnPb BGA.

In the limited space available, only a small selection of the reliability data has been shown, for more details please refer to the Linear Technology website.

About the author
Steve Munns is Mil-Aero marketing manager at Linear Technology Corporation

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Implementing analog functions in rugged, rad-hard FPGAs

Using stable, reliable systems for mission-critical video walls

. Mil-Aero top 10 'How-To' articles for 2012


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Microsemi Elected to Lead 'ELCOSINT' Team to Develop Material for High-temperature Electronics Applications

Microsemi Elected to Lead 'ELCOSINT' Team to Develop Material for High-temperature Electronics Applications (NASDAQ:MSCC):

Project Participants Include UK's National Physical Laboratory and Gwent Electronic Materials
ALISO VIEJO, Calif., Feb. 26, 2013 /PRNewswire/ -- Microsemi Corporation (Nasdaq: MSCC), a leading provider of semiconductor solutions differentiated by power, security, reliability and performance, today announced that it has been elected to lead the Electronic Component Sintered Interconnections (ELCOSINT) industry team in developing novel polymeric, sintered interconnection materials to replace high lead (Pb) content materials and further increase the operating temperature of electronic assemblies. These materials will be suitable for components subjected to extremely high operating temperatures of 250 degrees C or more, which often occur in market sectors such as aerospace and down hole drilling.
(Logo: http://photos.prnewswire.com/prnh/20110909/MM66070LOGO)
The three-year ELCOSINT project is partially funded by the Technology Strategy Board, an executive non-departmental public body established by the United Kingdom government to stimulate technology-enabled innovation. Microsemi will collaborate on the project with the UK's National Physical Laboratory, a world-leading center of excellence in developing and applying the most accurate measurement standards, science and technology available; and Gwent Electronic Materials LTD, a supplier of sophisticated and cost-effective electronics materials.
About the ELCOSINT Project
The multi-disciplinary ELCOSINT project team will develop the materials and manufacturing process for electronic component interconnection using nano-silver based materials to form joints between components and substrates. The technology will be compatible with standard microelectronics manufacturing processes, and replacing high-lead solder with nano-silver based materials will enable improved performance in harsh environments. It is also more environmentally friendly.
A high temperature sensor amplifier demonstrator will be designed and produced that will allow the characterization, assessment and qualification of the developments to enable rapid production of reliable, robust electronic systems.
About Microsemi
Microsemi Corporation (Nasdaq: MSCC) offers a comprehensive portfolio of semiconductor and system solutions for communications, defense & security, aerospace and industrial markets. Products include high-performance, radiation-hardened and highly reliable analog mixed-signal integrated circuits, FPGAs, SoCs and ASICs; power management products; timing and voice processing devices; RF solutions; discrete components; security technologies and scalable anti-tamper products; Power-over-Ethernet ICs and midspans; as well as custom design capabilities and services. Microsemi is headquartered in Aliso Viejo, Calif. , and has approximately 3,000 employees globally. Learn more at www.microsemi.com.
Microsemi and the Microsemi logo are registered trademarks or service marks of Microsemi Corporation and/or its affiliates. Third-party trademarks and service marks mentioned herein are the property of their respective owners.
"Safe Harbor" Statement under the Private Securities Litigation Reform Act of 1995: Any statements set forth in this news release that are not entirely historical and factual in nature, including without limitation statements related to its leadership role in the Electronic Component Sintered Interconnections (ELCOSINT) industry team in developing novel polymeric, sintered interconnection materials to replace high lead (Pb) content materials and further increase the operating temperature of electronic assemblies, and its potential effects on future business, are forward-looking statements. These forward-looking statements are based on our current expectations and are inherently subject to risks and uncertainties that could cause actual results to differ materially from those expressed in the forward-looking statements. The potential risks and uncertainties include, but are not limited to, such factors as rapidly changing technology and product obsolescence, potential cost increases, variations in customer order preferences, weakness or competitive pricing environment of the marketplace, uncertain demand for and acceptance of the company's products, adverse circumstances in any of our end markets, results of in-process or planned development or marketing and promotional campaigns, difficulties foreseeing future demand, potential non-realization of expected orders or non-realization of backlog, product returns, product liability, and other potential unexpected business and economic conditions or adverse changes in current or expected industry conditions, difficulties and costs of protecting patents and other proprietary rights, inventory obsolescence and difficulties regarding customer qualification of products. In addition to these factors and any other factors mentioned elsewhere in this news release, the reader should refer as well to the factors, uncertainties or risks identified in the company's most recent Form 10-K and all subsequent Form 10-Q reports filed by Microsemi with the SEC. Additional risk factors may be identified from time to time in Microsemi's future filings. The forward-looking statements included in this release speak only as of the date hereof, and Microsemi does not undertake any obligation to update these forward-looking statements to reflect subsequent events or circumstances.
MSCCP
SOURCE Microsemi Corporation


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Tuesday, March 5, 2013

New 'ELCOSINT' Nanosilver Project for High-temperature Electronics Applications

Microsemi Corporation a leading provider of semiconductor solutions differentiated by power, security, reliability and performance, today announced that it has been elected to lead the Electronic Component Sintered Interconnections (ELCOSINT) industry team in developing novel polymeric, sintered interconnection materials to replace high lead (Pb) content materials and further increase the operating temperature of electronic assemblies. These materials will be suitable for components subjected to extremely high operating temperatures of 250 degrees C or more, which often occur in market sectors such as aerospace and down hole drilling.

(Logo: http://photos.prnewswire.com/prnh/20110909/MM66070LOGO)

The three-year ELCOSINT project is partially funded by the Technology Strategy Board, an executive non-departmental public body established by the United Kingdom government to stimulate technology-enabled innovation. Microsemi will collaborate on the project with the UK's National Physical Laboratory, a world-leading center of excellence in developing and applying the most accurate measurement standards, science and technology available; and Gwent Electronic Materials LTD, a supplier of sophisticated and cost-effective electronics materials.

About the ELCOSINT Project
The multi-disciplinary ELCOSINT project team will develop the materials and manufacturing process for electronic component interconnection using nano-silver based materials to form joints between components and substrates. The technology will be compatible with standard microelectronics manufacturing processes, and replacing high-lead solder with nano-silver based materials will enable improved performance in harsh environments. It is also more environmentally friendly.

A high temperature sensor amplifier demonstrator will be designed and produced that will allow the characterization, assessment and qualification of the developments to enable rapid production of reliable, robust electronic systems.

Friday, March 1, 2013

Lead-free solder patent - Cr/Co/Al/W + Cr/Co/Al/W/Ge/Ga/Ni + B.Zr/Hf/Nb/C

Very obscure - possibly not for electronics..

solder alloy including a base material, a solder, and an additive is provided. The solder alloy has the following formula: (1-x-y)*base material x*solder y*additive, where 0.2!<=x!<=0.8 and 0!<=y<0.8 and also (y<1-x)<(1-x). The base material includes chromium, cobalt, aluminum, and tungsten. The solder includes chromium, cobalt, aluminum, tungsten, germanium and/or gallium and nickel. The additive may include boron, zirconium, hafnium, niobium, and carbon


age bookmark US2013045129  (A1)  -  SOLDER ALLOY, SOLDERING METHOD AND COMPONENT
Inventor(s): OTT MICHAEL [DE]; PIEGERT SEBASTIAN [DE] +
Applicant(s): OTT MICHAEL [DE]; PIEGERT SEBASTIAN [DE] +
Classification:
- international: B23K35/24; C22C19/05; C22C30/00
- cooperative: B23K35/30; F01D5/005; F05B2230/238; Y02T50/67
Application number: US201013639142 20100412 
Priority number(s): WO2010EP54756 20100412
Also published as: WO2011127958 (A2)  EP2558244 (A2) 

Honeywell lead-free solder patent - Zinc + Alumunium, magnesium, gallium

A solder may include zinc, aluminum, magnesium and gallium. The zinc may be present in an amount from about 82% to 96% by weight of the solder. The aluminum may be present in an amount from about 3% to about 15% by weight of the solder. The magnesium may be present in an amount from about 0.5% to about 1.5% by weight of the solder. The gallium may be present in an amount between about 0.5% to about 1.5% by weight of the solder.



Page bookmark US2013045131  (A1)  -  Lead-Free Solder Compositions
Inventor(s): LI JIANXING [US]; PINTER MICHAEL R [US]; STEELE DAVID E [US] +
Applicant(s): HONEYWELL INT INC [US]; LI JIANXING [US]; PINTER MICHAEL R [US]; STEELE DAVID E [US] +
Classification:
- international: B22D18/00; B23K35/24; C22C18/04
- cooperative:
Application number: US201213586074 20120815 
Priority number(s): US201213586074 20120815 ; US201161524610P 20110817
Also published as: WO2013025990 (A2) 

Thursday, February 14, 2013

Air Products to Demonstrate Electron Attachment Activated Hydrogen Technology at IPC APEX Expo

Air Products to Demonstrate Electron Attachment Activated Hydrogen Technology at IPC APEX Expo:

Air Products will highlight advances in its proprietary electron attachment (EA) technology for soldering applications at the IPC APEX Expo in San Diego, Calif., from February 19-21. IPC APEX attendees can stop by Air Products Booth #2708 to learn about the advantages of EA activated hydrogen over plasma-based and flux-based processes for cleaning soldering surfaces during electronics assembly and packaging. These advantages include improved solder wetting, lower reflow temperature, decreased overall voiding tendency, and no flux residue-related problems.

In addition, Dr. Christine Dong , lead research scientist for merchant gases technology at Air Products, will present the results of a study on EA technology titled "Fluxless Die Attach by Activated Forming Gas." The study demonstrates that it is possible to achieve a high-quality die attach with zero or near-zero voids by using EA. Dr. Dong's presentation is part of the Novel Attachment Technologies and Processes (S34) conference paper session to be held on Thursday, February 21, from 10:15 AM to 12:00 PM. IPC APEX attendees can register to learn how EA-activated forming gas can effectively clean soldering surfaces during fluxless die attach, bringing numerous advantages compared with conventional flux-based processes.
Air Products representatives will be available at the booth to speak with IPC APEX attendees about the company's complete range of application technologies and solutions that can help electronics packaging and assembly customers improve productivity and optimize their total cost of ownership. Among these solutions are the use of nitrogen reflow for Head-in-Pillow defect reduction and Air Products Inert Wave Soldering technology, which has helped an electronics contract assembly company reduce wave solder defects by 90%, enabling them to achieve improved production efficiencies and cost savings.
Air Products is a leading supplier of specialty gases and chemicals, bulk gases, and delivery equipment and services to the global electronics industry. For more than 25 years, the company has been providing the electronics packaging, assembly and test industry with technology, gases, and know-how for wave, reflow, and selective soldering. In addition to printed circuit assembly processes, Air Products' global technology team can support several areas of integrated circuit packaging assembly. With a complete portfolio of reliable gas supply options¯from liquid/bulk gases to a host of on-site production technologies¯Air Products can meet the purity requirement, volume, or usage pattern of any customer, anywhere around the world. For more information, visit www.airproducts.com/electronics_assembly.

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Tuesday, January 29, 2013

Taking a close look at voids in BGA solder balls

Taking a close look at voids in BGA solder balls:

Researchers are questioning the impact of voids in BGA solder balls. They may not cause defects, which may prompt a revision of standards that set defect levels for voids.

 
January 21, 2013

By Terry Costlow, IPC online editor

Manufacturing processes evolve as clever employees find ways to eliminate defects. Ball grid arrays (BGAs) are a case in point: Some defects like solder ball voids were once considered a major problem, but some researchers say they’re no longer an issue.

As ball sizes and spacing have shrunk and processes have improved, voids in solder balls may no longer be a problem. That’s a marked change from years past, and one that may call for a standard revision.

For years, J-STD-001, Requirements for Soldered Electrical and Electronic Assemblies, and IPC-A-610, Acceptability of Electronic Assemblies, had very specific guidelines for BGA solder balls. The standards say BGAs are defective when voids account for more than 25 percent of an X-ray image area. But many say that as more industry investigations have been completed, that criterion is no longer valid.

When those standards were written, lead spacings were around 1.27 mm and ball diameters were around 30 mils. Now spacings are 0.5-0.8 mm and ball sizes are 10-20 mils.

“At those dimensions, if you get a void in the solder ball, there is a high probability it’s going to be greater than 25 percent of the X-ray image area,” said Dave Hillman, principal materials and process engineer at Rockwell Collins.

Some say that voids degrade the solder ball joint, while others have done research showing that voids have little impact on reliability. Solder joints with voids of any size likely have other problems that would cause failure.

“There may be some confounding issues in test methodologies. When you’re seeing a wide diversity in industry BGA void test results, it can mean test vehicles, test parameters or testing condition setups are having an influence on the test results in contrast to other industry tests,” Hillman said.

Hillman will provide more detail at IPC APEX EXPO® in San Diego February 19-21. The title of his Wednesday morning technical conference session lays out his views on the topic: “The Last Will and Testaments of Tin/Lead and Lead-Free BGA Voids.”

Hillman, who has worked closely with Hewlett Packard’s Chris Troxel and Linda Woody of Lockheed Martin Missile and Fire Control on this issue, feels that it’s time to alter IPC standards to eliminate the defect criteria on voids.

“If all of the industry data is reviewed and BGA voids are determined to not be a defect, voids shouldn’t be in the standards as a defect,” Hillman said.

Instead of focusing on defects, manufacturers should tweak their processes when they see an increase of void occurrence or size. Changes in the appearance, size or shape of solder contacts often suggest that the process is beginning to go out of range. Monitoring the process can be more effective than testing for defects.

“J-STD-001E and IPC-A-610 use process control methodologies/protocols in a number of solder process areas rather than 100 percent visual inspection,” Hillman said.

While noting that there are many benefits to inspection with the broad range of tools now available, Hillman commented that there can be cases where visual inspections are no longer beneficial. That can be the case with solder voids, which aren’t visible without advanced inspection equipment.

“One of the negative aspects of X-ray inspection is that it lets you see things you couldn’t see before. A process engineer now needs to make a determination if the things being seen are a problem or an observation. Voids in BGAs are the poster child for this issue,” Hillman said. “You get more immediate benefits by establishing consistent solder processes than scanning for voids after the fact.”

Hillman feels that it’s important to update standards as more knowledge is gained. When J-STD-001 and IPC-A-610 were written, solder voids were thought to be a problem. But as technology has advanced and new test data is accumulated, researchers have found that they’re something of a red herring.

“A willingness to change workmanship criteria shows the flexibility of the industry and IPC,” Hillman said.

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Thursday, January 10, 2013

Enhancing the Ductility of Sn-Ag-Cu Lead-Free Solder Joints by Addition of Compliant Intermetallics

Scopus - Document details: "Journal of Electronic Materials
2012, Pages 1-10"

Adding rare earth elements to lead free solders have been known to have desirable effects, such as refinement of the microstructure and increasing the ductility. In this paper, Sn-3.9Ag-0.7Cu is doped with Ca & Mn to investigate the role that the soft IMC has in enhancing the ductility.

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Friday, January 4, 2013

100°C drop in melting point could help make Nano-Solders a reality

Reduction synthesis of tin nanoparticles using various precursors and melting behavior - Springer: "To achieve a more significant melting point drop through finer particles, chemical reduction synthesis of tin nanoparticles were conducted using four tin precursor agents: tin(II) acetate, tin(II) chloride, tin(II) sulfate, and tin(II) 2-ethylhexanoate. Depending on the precursor type, the sizes and size distributions of the synthesized Sn nanoparticles were highly diverse. Tin nanoparticles synthesized with tin(II) sulfate or tin(II) 2-ethylhexanoate displayed characteristics of monodispersity at reduced size. The nanoparticles had average diameters of just ∼3 nm and ∼6 nm, respectively, and exhibited melting points of 102.2°C and 131.1°C, which represented extreme drops by 130.4°C and 101.5°C in comparison with the melting point of bulk tin."

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